Xiaoqin Wu
Abstract:
We study a model for the semiconductor problem that consists
of a system of dynamic thermoelasticity equations of displacement
and semiconductor equations. This problem arises from the
observation that semiconductor devices are too often cracked and
broken because of the thermal stresses. Since the heat source
generated by Joule heating is quadratic in the gradient of the
electrical potential, this causes some problem even in analysis.
We establish the existence theorem of a weak solution. The proof
is based on time retarding.
Published April 15, 2009.
Math Subject Classifications: 35M10, 35Q99.
Key Words: Thermoelastic semiconductor equations; existence.
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Xiaoqin Wu Department of Mathematics, Computer and Information Sciences Mississippi Valley State University Itta Bena, MS 38941, USA email: xpaul_wu@yahoo.com |
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